TDDB characteristic and breakdown mechanism of ultra thin SiO_2/HfO_2 bilayer ga

Name: TDDB characteristic and breakdown mechanism of ultra thin SiO_2/HfO_2 bilayer ga
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Author: thereborn

上传者：thereborn 2021-02-19 13:37:59上传 PDF文件 1.29MB 热度 27次

TDDB characteristic and breakdown mechanism of ultra-thin SiO_2/HfO_2 bilayer gate dielectrics

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TDDB characteristic and breakdown mechanism of ultra thin SiO_2HfO_2bilayer ga

TDDB characteristic and breakdown mechanism of ult...

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