Structural properties of In doped ZnO thin films analyzed by x ray diffraction a

Name: Structural properties of In doped ZnO thin films analyzed by x ray diffraction a
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Author: 52005lzj

上传者：52005lzj 2020-07-19 00:25:07上传 PDF文件 426.86KB 热度 38次

掠射和θ-2θ方式X射线衍射分析In掺杂ZnO薄膜结构特性，兰伟，，采用溶胶凝胶法,结合旋转涂敷技术在石英衬底上制备了In掺杂ZnO薄膜.薄膜的结构特性使用掠角入射X射线衍射(GI-XRD)和常规X射线衍射共同�

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掠射和θ-2θ方式X射线衍射分析In掺杂ZnO薄膜结构特性，兰伟，，采用溶胶凝胶法,结合旋转涂敷技术...

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