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NMOSFET栅长对热载流子效应的影响

上传者: 2021-02-07 15:21:49上传 PDF文件 874.88KB 热度 19次
The hot-carrier effect (HCE) in different channellength NMOSFETs is studied in this letter. It is foundthat the HCE becomes more serious with the channel length decreasing, which results in serious degradations of the threshold voltage and saturation drain current..Moreover, the relationships of
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