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MPC5675K Test and Shadow Flash Parameters for ADC Self-Test, MBIST, and LBIST

上传者: 2022-07-24 08:50:35上传 PDF文件 225.39 KB 热度 18次

MPC5675KTestandShadowFlashParametersforADCSelf-Test,MBIST,andLBISTFreescaleSemiconductorDocumentNumber:AN4422ApplicationNoteRev.0,02/2012MPC5675KTestandShadowFlashParametersforADCSelf-Test,MBIST,andLBISTby:CurtHillierApplicationsEngineeringAustin,TexasUSAContents1Introduction1Introduction................................................................1TheMPC5675Kmicrocontrolleroffersasetoffeaturesto2Shadowflashcontents―factorysupportfunctionalsafetyapplications.Memory,digi

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