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Electron beam induced degradation of halide perovskite related semiconductor nan

上传者: 2021-02-24 03:59:59上传 PDF文件 1.01MB 热度 17次
The instability of lead halide perovskites in various application-related conditions is a key challenge to be resolved. We investigated the formation of metal nanoparticles during transmission electron microscopy (TEM) imaging of perovskite-related metal halide compounds. The metal nanoparticle form
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