EOS与ESD

EOS与ESDEOS/ESDTestingTodayEOSorESD?ESD-Electro-StaticDischarge“Equalizationofdifferentelectrostaticpotentialsbetweentwoormoreobjects”EOS-ElectricalOver-Stress“Anelectricaleventthatisoutsidethespecifiedrangeofthedeviceundertest”(Latch-up)2EOSorESD!BothwilldamagedevicesbyarapidlocalizedheatingofthesemiconductormaterialorbyrapidlycreatingstrongelectricalfieldsCritically,evenverysmalldischargesorover-stresscanbefatalorcauselatentfailures3DominantESDTestMethods(HBM)HumanBodyModel(MM)MachineModel(CDM)ChargedDeviceModel