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Analysis of the magnitude and distribution of low loss thin film

上传者: 2021-02-22 19:03:52上传 PDF文件 334.55KB 热度 20次
Total loss test of the high-reflective (HR) film coated on super-smooth silica substrate by dual ion beam sputtering (DIBS) is based on the well-established cavity ring-down technique. Scattering and transmittance are tested by integral scattering and transmittance measuring apparatus, after which a
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