Gate length dependence of hot carrier injection degradation in short channel sil

Name: Gate length dependence of hot carrier injection degradation in short channel sil
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Author: am_king21824

上传者：am_king21824 2021-02-09 18:10:45上传 PDF文件 2.76MB 热度 41次

Gate length dependence of hot carrier injection degradation in short channel silicon on insulator planar MOSFET

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Gate length dependence of hot carrier injection degradation in short channel sil

Gate length dependence of hot carrier injection de...

大小：2.76MB | 2021-02-09 18:10:45
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