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Scanning electron microscopy as a flexible technique for investigating the prope

上传者: 2021-01-31 02:26:26上传 PDF文件 1.55MB 热度 10次
In this paper we describe the scanning electron microscopy techniques of electron backscatter diffraction, electron channeling contrast imaging, wavelength dispersive X-ray spectroscopy, and cathodoluminescence hyperspectral imaging. We present our recent results on the use of these non-destructive
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