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ESD Protection for High IO port.doc

上传者: 2020-07-29 08:50:23上传 DOC文件 105.5KB 热度 29次
An integrated circuit (IC) connected to external ports is susceptible to damaging electrostatic discharge (ESD) pulses from the operating environment and peripherals. The same ever-shrinking IC process technology that enables such high-port interconnect data rates can also suffer from higher ESD sus
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