LTEandEvolutionto4GWirelessDesignandMeasurementChallenges(2ndE)--2013
ThisbookpresentsthelatestdetailsonLTEfromapracticalandtechnicalperspective.WrittenbyAgilent’smeasurementexperts,itoffersavaluableinsightintoLTEtechnologyanditsdesignandtestchallenges.Chapterscovertheupperlayersignalingandsystemarchitectureevolution(SAE).BasicconceptssuchasMIMOandSC-F
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好新的书，对于LTE设计与测试都有不错的概述。